Texture of equal channel angular pressed Cu investigated by electron back scatter diffraction and X-ray diffraction SCHAFLER, E., KOPACZ, I., PIPPAN, R., STUEWE, H.-P. vol. 43 (2005), no. 6, pp. 422 - 431
Abstract The texture evolution of copper during route A and C – ECAP has been measured by standard X-ray technique as well as determined by electron back scatter diffraction, the latter monitors also the grain shape changes and the fragmentation during the high strain deformation. The orientation distribution functions were compared and discussed with respect to the subgrain division. With each pass of route A a further elongation and rotation of the grains is observable, while the alternating shear direction when processing route C results in roughly equi-axed grains. The high imposed strains cause formation of new boundaries subdividing the old grains. With proceeding deformation the increasing misorientation in this subgrain structure leads to further fragmentation of the material, what accounts for the good correspondence between microtexture determined by EBSD on relatively small areas and macrotexture obtained by XRD. Key words severe plastic deformation, macrotexture, microtexture Full text (1033 KB)
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