Abstract
Degradation of Ti-stabilized interstitial free steel and damage of this steel caused by selective oxidation during 60 s of recrystallization annealing at 820 °C under the different compositions of protective H₂-N₂ atmosphere at low dew point (-40 °C) was investigated using X-ray photoelectron spectroscopy (XPS), scaning electron microscopy (SEM) and energy dispersive spectrometry (EDS). During the high-temperature annealing the reduction of the native Fe-oxide layer occurred. Results of the analyses also showed that Mn, Al and Si oxide particles are the main products of selective external and internal oxidation. Moreover, appearance of greater nonwetted surface areas was caused by the increase of the H₂ content in gas atmosphere, which favors external oxidation.

Key words
Ti-IF steel; selective oxidation; material damage; XPS; SEM; EDS

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